Richard S. Silver: search on Z-Library

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1

Treatment Outcomes in Depression: Comparison of Remote Treatment Through Telepsychiatry to In-Person Treatment

Ruskin, Paul E., Silver-Aylaian, Michele, Kling, Mitchel A., Reed, Susan A., Bradham, Douglas D., Hebel, J. Richard, Barrett, David, Knowles, Frederick, Hauser, Peter

Journal:

American Journal of Psychiatry

Year:

2004

Language:

english

File:

PDF, 129 KB

english, 2004

2

Bowel Obstruction

Gore, Richard M., Silvers, Robert I., Thakrar, Kiran H., Wenzke, Daniel R., Mehta, Uday K., Newmark, Geraldine M., Berlin, Jonathan W.

Journal:

Radiologic Clinics of North America

Year:

2015

Language:

english

File:

PDF, 3.72 MB

english, 2015

3

Political efficacy and trust: A report on the NES pilot study items

Stephen C. Craig, Richard G. Niemi, Glenn E. Silver

Journal:

Political Behavior

Year:

1990

Language:

english

File:

PDF, 1.77 MB

english, 1990

4

Early Processes of Institutionalization: The Dramaturgy of Exchange in Interorganizational Relations

R. Richard Ritti and Jonathan H. Silver

Journal:

Administrative Science Quarterly

Year:

1986

Language:

english

File:

PDF, 2.35 MB

english, 1986

5

Interferon and the treatment of polycythemia vera, essential thrombocythemia and myelofibrosis

Silver, Richard T, Kiladjian, Jean-Jacques, Hasselbalch, Hans Carl

Journal:

Expert Review of Hematology

Year:

2013

Language:

english

File:

PDF, 942 KB

english, 2013

6

Effects of wafer noise on the detection of 20-nm defects using optical volumetric inspection

Barnes, Bryan M., Goasmat, Francois, Sohn, Martin Y., Zhou, Hui, Vladár, András E., Silver, Richard M.

Journal:

Journal of Micro/Nanolithography MEMS and MOEMS

Year:

2015

Language:

english

File:

PDF, 5.15 MB

english, 2015

7

Structure dependence of final-state effects in deep inelastic neutron scattering: Quasiclassical theory

Silver, Richard N., Reiter, George

Journal:

Physical Review B

Year:

1987

Language:

english

File:

PDF, 181 KB

english, 1987

8

SPIE Proceedings [SPIE Microlithography 2005 - San Jose, CA (Sunday 27 February 2005)] Metrology, Inspection, and Process Control for Microlithography XIX - Precision carbon nanotube tip for critical dimension measurement with atomic force microscope

Park, B. C., Silver, Richard M., Jung, K. Y., Hong, J., Song, W. Y., O, B.-h., Kim, J. A.

Year:

2005

Language:

english

File:

PDF, 263 KB

english, 2005

9

Risk Factors for Mortality and Cardiopulmonary Hospitalization in Systemic Sclerosis Patients At Risk for Pulmonary Hypertension, in the PHAROS Registry

Hsu, Vivien M., Chung, Lorinda, Hummers, Laura K., Shah, Ami, Simms, Robert, Bolster, Marcy, Hant, Faye N., Silver, Richard M., Fischer, Aryeh, Hinchcliff, Monique E., Varga, John, Goldberg, Avram Z.,

Journal:

The Journal of Rheumatology

Year:

2018

Language:

english

File:

PDF, 138 KB

english, 2018

10

SPIE Proceedings [SPIE SPIE Optical Metrology 2013 - Munich, Germany (Monday 13 May 2013)] Modeling Aspects in Optical Metrology IV - Mathematical model of a galvanometer-based scanner: simulations and experiments

Mnerie, Corina, Preitl, Stefan, Duma, Virgil-Florin, Bodermann, Bernd, Frenner, Karsten, Silver, Richard M.

Year:

2013

Language:

english

File:

PDF, 1016 KB

english, 2013

11

Early onset as a marker for disease severity in FSHD

Goselink, Rianne J.M., Mul, Karlien, van Kernebeek, Caroline R., Lemmers, Richard J.L.F., van der Maarel, Silvère M., Schreuder, Tim H.A., Erasmus, Corrie E., Padberg, George W., Statland, Jeffrey M.,

Journal:

Year:

2018

Language:

english

File:

PDF, 381 KB

english, 2018

12

[ACM Press the 26th Annual International Conference - Montreal, Quebec, Canada (2009.06.14-2009.06.18)] Proceedings of the 26th Annual International Conference on Machine Learning - ICML '09 - Fast gradient-descent methods for temporal-difference learning with linear function approximation

Sutton, Richard S., Maei, Hamid Reza, Precup, Doina, Bhatnagar, Shalabh, Silver, David, Szepesvári, Csaba, Wiewiora, Eric

Year:

2009

Language:

english

File:

PDF, 812 KB

english, 2009

13

SPIE Proceedings [SPIE Microlithography 2005 - San Jose, CA (Sunday 27 February 2005)] Metrology, Inspection, and Process Control for Microlithography XIX - Advances in phase-grating-based wafer alignment systems

Keij, Stefan, Silver, Richard M., Setija, Irwan, van der Zouw, Gerbrand, Ebert, Earl

Year:

2005

File:

PDF, 331 KB

2005

14

SPIE Proceedings [SPIE SPIE's 27th Annual International Symposium on Microlithography - Santa Clara, CA (Sunday 3 March 2002)] Metrology, Inspection, and Process Control for Microlithography XVI - Comparison of measured optical image profiles of silicon lines with two different theoretical models

Silver, Richard M., Attota, Ravikiran, Stocker, M., Jun, Jau-Shi J., Marx, Egon, Larrabee, Robert D., Russo, Beth, Davidson, Mark P., Herr, Daniel J. C.

Year:

2002

Language:

english

File:

PDF, 770 KB

english, 2002

15

Management of Hyponatremia in the ICU

Sterns, Richard H., Hix, John K., Silver, Stephen M.

Journal:

Year:

2013

Language:

english

File:

PDF, 130 KB

english, 2013

16

Scatterfield microscopy for extending the limits of image-based optical metrology

Silver, Richard M., Barnes, Bryan M., Attota, Ravikiran, Jun, Jay, Stocker, Michael, Marx, Egon, Patrick, Heather J.

Journal:

Year:

2007

Language:

english

File:

PDF, 3.06 MB

english, 2007

17

SPIE Proceedings [SPIE SPIE's 1995 Symposium on Microlithography - Santa Clara, CA (Sunday 19 February 1995)] Integrated Circuit Metrology, Inspection, and Process Control IX - Overlay measurements and standards

Silver, Richard M., Potzick, James E., Larrabee, Robert D., Bennett, Marylyn H.

Year:

1995

Language:

english

File:

PDF, 519 KB

english, 1995

18

Deep subwavelength nanometric image reconstruction using Fourier domain optical normalization

Qin, Jing, Silver, Richard M, Barnes, Bryan M, Zhou, Hui, Dixson, Ronald G, Henn, Mark-Alexander

Journal:

Light: Science & Applications

Year:

2016

Language:

english

File:

PDF, 41.69 MB

english, 2016

19

Janus kinase-2 inhibitor fedratinib in patients with myelofibrosis previously treated with ruxolitinib (JAKARTA-2): a single-arm, open-label, non-randomised, phase 2, multicentre study

Harrison, Claire N, Schaap, Nicolaas, Vannucchi, Alessandro M, Kiladjian, Jean-Jacques, Tiu, Ramon V, Zachee, Pierre, Jourdan, Eric, Winton, Elliott, Silver, Richard T, Schouten, Harry C, Passamonti,

Journal:

The Lancet Haematology

Year:

2017

Language:

english

File:

PDF, 757 KB

english, 2017

20

SPIE Proceedings [SPIE Microlithography 2003 - Santa Clara, CA (Sunday 23 February 2003)] Metrology, Inspection, and Process Control for Microlithography XVII - Calibration strategies for overlay and registration metrology

Silver, Richard M., Stocker, Michael T., Attota, Ravikiran, Bishop, Michael, Jun, Jau-Shi J., Marx, Egon, Davidson, Mark P., Larrabee, Robert D., Herr, Daniel J.

Year:

2003

Language:

english

File:

PDF, 1.01 MB

english, 2003

21

Penile Length in Adulthood After Exstrophy Reconstruction

Silver, Richard I., Yang, Andrew, Ben-Chaim, Jacob, Jeffs, Robert D., Gearhart, John P.

Journal:

The Journal of Urology

Year:

1997

Language:

english

File:

PDF, 1.29 MB

english, 1997

22

Public Perceptions of Traumatic Events and Policy Preferences during the George W. Bush Administration: A Portrait of America in Turbulent Times

Shambaugh, George, Matthew, Richard, Silver, Roxane Cohen, McDonald, Bryan, Poulin, Michael, Blum, Scott

Journal:

Studies in Conflict & Terrorism

Year:

2009

Language:

english

File:

PDF, 2.38 MB

english, 2009

23

SPIE Proceedings [SPIE Microlithography 2004 - Santa Clara, CA (Sunday 22 February 2004)] Metrology, Inspection, and Process Control for Microlithography XVIII - Segmented alignment mark optimization and signal strength enhancement for deep trench process

Cui, Yuanting, Silver, Richard M., Goodwin, Frank, van Haren, Richard

Year:

2004

Language:

english

File:

PDF, 500 KB

english, 2004

24

SPIE Proceedings [SPIE Microlithography 2005 - San Jose, CA (Sunday 27 February 2005)] Metrology, Inspection, and Process Control for Microlithography XIX - In-chip overlay measurement by existing bright-field imaging optical tools

Ku, Yi-Sha, Silver, Richard M., Tung, Chi-Hong, Smith, Nigel P.

Year:

2005

Language:

english

File:

PDF, 144 KB

english, 2005

25

[Studies in Public Choice] The State as a Firm Volume 3 ||

Auster, Richard D., Silver, Morris

Year:

1979

Language:

english

File:

PDF, 17.44 MB

english, 1979

26

Immunohistochemical Description of Nitric Oxide Synthase Isoforms in Human Clitoris

Burnett, Arthur L., Calvin, David C., Silver, Richard I., Peppas, Dennis S., Docimo, Steven G.

Journal:

The Journal of Urology

Year:

1997

Language:

english

File:

PDF, 1.80 MB

english, 1997

27

Temporal-difference search in computer Go

David Silver, Richard S. Sutton, Martin Müller

Journal:

Machine Learning

Year:

2012

Language:

english

File:

PDF, 1.88 MB

english, 2012

28

SPIE Proceedings [SPIE Microlithography 2004 - Santa Clara, CA (Sunday 22 February 2004)] Metrology, Inspection, and Process Control for Microlithography XVIII - Linewidth measurement simulations for semiconductor circuits by scatterometry using FDTD and time shortening calculation method

Shirasaki, Hirokimi, Silver, Richard M., Ueta, Kunio

Year:

2004

Language:

english

File:

PDF, 180 KB

english, 2004

29

SPIE Proceedings [SPIE SPIE's 1996 International Symposium on Microlithography - Santa Clara, CA (Sunday 10 March 1996)] Metrology, Inspection, and Process Control for Microlithography X - High-accuracy overlay measurements

Silver, Richard M., Potzick, James E., Scire, Fredric, Larrabee, Robert D., Jones, Susan K.

Year:

1996

Language:

english

File:

PDF, 575 KB

english, 1996

30

Electronic Health Record–Based Monitoring of Primary Care Patients at Risk of Medication-Related Toxicity

Bundy, David G., Marsteller, Jill A., Wu, Albert W., Engineer, Lilly D., Berenholtz, Sean M., Caughey, A. Harrison, Silver, David, Tian, Jing, Thompson, Richard E., Miller, Marlene R., Lehmann, Christ

Journal:

The Joint Commission Journal on Quality and Patient Safety

Year:

2012

Language:

english

File:

PDF, 578 KB

english, 2012

31

Design of angle-resolved illumination optics using nonimaging bi-telecentricity for 193 nm scatterfield microscopy

Sohn, Martin Y., Barnes, Bryan M., Silver, Richard M.

Journal:

Optik - International Journal for Light and Electron Optics

Year:

2018

Language:

english

File:

PDF, 2.55 MB

english, 2018

32

Atom-by-atom construction of a cyclic artificial molecule in Silicon

Wyrick, Jonathan, Wang, Xiqiao, Namboodiri, Pradeep, Schmucker, Scott W., Kashid, Ranjit, Silver, Richard

Journal:

Year:

2018

Language:

english

File:

PDF, 794 KB

english, 2018

33

Melanotic macule of nail unit and its clinicopathologic spectrum

Sameera Husain, Richard K. Scher, David N. Silvers, A. Bernard Ackerman

Journal:

Journal of the American Academy of Dermatology

Year:

2006

Language:

english

File:

PDF, 371 KB

english, 2006

34

Simplified kinetic theories for electron-hole condensation

Silver, Richard N.

Journal:

Physical Review B

Year:

1977

Language:

english

File:

PDF, 221 KB

english, 1977

35

SPIE Proceedings [SPIE Microlithography 2005 - San Jose, CA (Sunday 27 February 2005)] Metrology, Inspection, and Process Control for Microlithography XIX - Comprehensive CD uniformity control across lithography and etch

Zhang, Qiaolin, Tang, Cherry, Hsieh, Tony, Maccrae, Nick, Singh, Bhanwar, Poolla, Kameshwar, Spanos, Costas J., Silver, Richard M.

Year:

2005

Language:

english

File:

PDF, 3.22 MB

english, 2005

36

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California (Sunday 12 February 2012)] Metrology, Inspection, and Process Control for Microlithography XXVI - Scatterfield microscopy of 22-nm node patterned defects using visible and DUV light

Barnes, Bryan M., Sohn, Yeung-Joon, Goasmat, Francois, Zhou, Hui, Silver, Richard M., Arceo, Abraham, Starikov, Alexander

Year:

2012

Language:

english

File:

PDF, 4.90 MB

english, 2012

37

SPIE Proceedings [SPIE Microlithography 2005 - San Jose, CA (Sunday 27 February 2005)] Metrology, Inspection, and Process Control for Microlithography XIX - Advances in hardware, software, and automation for 193nm aerial image measurement systems

Zibold, Axel M., Silver, Richard M., Schmid, R., Seyfarth, A., Waechter, M., Harnisch, W., Doornmalen, H. v.

Year:

2005

Language:

english

File:

PDF, 486 KB

english, 2005

38

Theory of deep inelastic neutron scattering. II. Application to normal and superfluid

Silver, Richard N.

Journal:

Physical Review B

Year:

1989

Language:

english

File:

PDF, 372 KB

english, 1989

39

SPIE Proceedings [SPIE Microlithography 2004 - Santa Clara, CA (Sunday 22 February 2004)] Metrology, Inspection, and Process Control for Microlithography XVIII - The estimation of total measurement uncertainty in a multiple metrology tool environment

Hwu, Justin J., Silver, Richard M., Pham, Thao J., Dulay, Sukhbir, Lopez, Andrew, Wilkens, Peter

Year:

2004

Language:

english

File:

PDF, 112 KB

english, 2004

40

Improving Analytic Reasoning via Crowdsourcing and Structured Analytic Techniques

van Gelder, Tim, Kruger, Ariel, Thomman, Sujai, de Rozario, Richard, Silver, Elizabeth, Saletta, Morgan, Barnett, Ashley, Sinnott, Richard O., Jayaputera, Glenn Tesla, Burgman, Mark

Journal:

Journal of Cognitive Engineering and Decision Making

Year:

2020

File:

PDF, 1.47 MB

2020

41

Renal Ultrasonography in Newborns With Prenatally Detected Hydronephrosis: Why Wait?

Docimo, Steven G., Silver, Richard I.

Journal:

The Journal of Urology

Year:

1997

Language:

english

File:

PDF, 322 KB

english, 1997

42

SPIE Proceedings [SPIE Microlithography 2004 - Santa Clara, CA (Sunday 22 February 2004)] Metrology, Inspection, and Process Control for Microlithography XVIII - Alignment offset analyzer against wafer-induced shift (WIS)

Matsumoto, Takahiro, Silver, Richard M., Ina, Hideki, Sentoku, Koichi

Year:

2004

Language:

english

File:

PDF, 407 KB

english, 2004

43

Treatment of hyponatremia

Sterns, Richard H, Hix, John Kevin, Silver, Stephen

Journal:

Current Opinion in Nephrology & Hypertension

Year:

2010

Language:

english

File:

PDF, 192 KB

english, 2010

44

Spatial Distribution of Prominin-1 (CD133) – Positive Cells within Germinative Zones of the Vertebrate Brain

Jászai, József, Graupner, Sylvi, Tanaka, Elly M., Funk, Richard H. W., Huttner, Wieland B., Brand, Michael, Corbeil, Denis, Silver, Debra L.

Journal:

Year:

2013

Language:

english

File:

PDF, 32.18 MB

english, 2013

45

Temporal kinetics and concentration–response relationships for induction of CYP1A, CYP2B, and CYP3A in primary cultures of beagle dog hepatocytes

Richard A. Graham, Lindsey O. Tyler, Wojciech L. Krol, Ivin S. Silver, Lindsey O. Webster, Philip Clark, Liangfu Chen, Troy Banks, Edward L. LeCluyse

Journal:

Journal of Biochemical and Molecular Toxicology

Year:

2006

Language:

english

File:

PDF, 4.02 MB

english, 2006

46

Ferrocenyl ligands-III. Bulky ferrocenyl derivatives. 1,1′-Bis(diphenylphosphino)-3,3′-bis(trimethylsilyl)ferrocene. Synthesis, metal complexation and the crystal and molecular structure

Richard A. Brown, Andrew Houlton, Roger M.G. Roberts, Jack Silver, Christopher S. Frampton

Journal:

Year:

1992

Language:

english

File:

PDF, 823 KB

english, 1992

47

SPIE Proceedings [SPIE SPIE Europe Optical Metrology - Munich, Germany (Monday 15 June 2009)] Modeling Aspects in Optical Metrology II - Angle-resolved optical metrology using multi-technique nested uncertainties

Silver, R. M., Barnes, B. M., Zhou, H., Zhang, N. F., Dixson, R., Bosse, Harald, Bodermann, Bernd, Silver, Richard M.

Year:

2009

Language:

english

File:

PDF, 2.20 MB

english, 2009

48

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, USA (Sunday 23 February 2014)] Metrology, Inspection, and Process Control for Microlithography XXVIII - Optical volumetric inspection of sub-20nm patterned defects with wafer noise

Cain, Jason P., Sanchez, Martha I., Barnes, Bryan M., Goasmat, Francois, Sohn, Martin Y., Zhou, Hui, Vladár, András E., Silver, Richard M., Arceo, Abraham

Year:

2014

Language:

english

File:

PDF, 4.37 MB

english, 2014

49

The large-scale structure of convection in the Earth's mantle

Olson, Peter, Silver, Paul G., Carlson, Richard W.

Journal:

Year:

1990

File:

PDF, 1.10 MB

1990

50

SPIE Proceedings [SPIE Microlithography 2005 - San Jose, CA (Sunday 27 February 2005)] Metrology, Inspection, and Process Control for Microlithography XIX - Arbitrary cross sections and stack forms measurement simulations for the semiconductor circuits by scatterometry

Shirasaki, Hirokimi, Silver, Richard M.

Year:

2005

Language:

english

File:

PDF, 266 KB

english, 2005

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